JPH0348545Y2 - - Google Patents
Info
- Publication number
- JPH0348545Y2 JPH0348545Y2 JP2996889U JP2996889U JPH0348545Y2 JP H0348545 Y2 JPH0348545 Y2 JP H0348545Y2 JP 2996889 U JP2996889 U JP 2996889U JP 2996889 U JP2996889 U JP 2996889U JP H0348545 Y2 JPH0348545 Y2 JP H0348545Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- receiving element
- switch
- signal
- light emitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 53
- 238000010586 diagram Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2996889U JPH0348545Y2 (en]) | 1989-03-16 | 1989-03-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2996889U JPH0348545Y2 (en]) | 1989-03-16 | 1989-03-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01144881U JPH01144881U (en]) | 1989-10-04 |
JPH0348545Y2 true JPH0348545Y2 (en]) | 1991-10-16 |
Family
ID=31254610
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2996889U Expired JPH0348545Y2 (en]) | 1989-03-16 | 1989-03-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0348545Y2 (en]) |
-
1989
- 1989-03-16 JP JP2996889U patent/JPH0348545Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPH01144881U (en]) | 1989-10-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5101153A (en) | Pin electronics test circuit for IC device testing | |
EP2022169B1 (en) | Mode selection amplifier circuit usable in a signal acquisition probe | |
US7414421B2 (en) | Insertable calibration device | |
CA1293863C (en) | Time measurement in automatic test equipment | |
HU189723B (en) | Logic measuring instrument | |
WO2001079863A3 (en) | Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester | |
JPS6324172A (ja) | 2チヤンネル・タイム・ドメイン・リフレクトメ−タ | |
CN109901089B (zh) | 一种数字单元测试仪的校准系统 | |
CN109342939B (zh) | 继电器综合参数测试系统的吸合释放时间校准装置及方法 | |
JPH0348545Y2 (en]) | ||
JP2606806B2 (ja) | 信号経路の電気的伝播時間の確認方法 | |
CN102981134B (zh) | 开关柜智能显示装置测试仪 | |
CN113009223B (zh) | 阻抗量测方法 | |
CN111312000A (zh) | 一种电能计量装置的校验培训装置 | |
CN217544123U (zh) | 一种芯片级联显示电路、显示装置和空调器 | |
US5337250A (en) | Apparatus for testing a microprocessor based register | |
GB2214319A (en) | Testing electronic circuits | |
US3411072A (en) | Test apparatus for indicating voltage and current conditions of plug-in components in their associated circuitry | |
JP4310280B2 (ja) | インピーダンス変換回路、入出力回路及び半導体試験装置 | |
CN112824983B (zh) | 时间测量电路、时间测量芯片及时间测量装置 | |
JPH028274B2 (en]) | ||
JPS6230971A (ja) | 半導体集積回路装置 | |
US4041384A (en) | Circuit system for adjusting the input of a connected-up logic circuit | |
KR910009008B1 (ko) | 전송선로 선번대조용 측정장치 | |
JPH0381118B2 (en]) |